IEEE Computer Society Workshop
on Biometrics

In association with CVPR 2009

June 25, 2009

Paper submission absolute deadline: Friday, March 13, 2009, 11:59pm. PST (Pacific Standard Time) 

General Chairs: Bir Bhanu & Nalini Ratha
Program Chair: Venu Govindaraju

CVPR Biometrics 2009 Final Program


Paper decisions and reviews are available now on the CMT website.
Please prepare the final version taking into account the reviewer comments and submit by April 15, 2009 (Absolute firm deadline from IEEE).
NOTE: Your paper will not be on the DVD distributed at the CVPR Conference if you miss the deadline.

a. Authors should upload their final "camera ready" PDFs to CMT.
b. Authors should complete an IEEE Copyright form electronically, using the facility in CMT.
c. Authors should use PDF eXpress to validate their files.

Here are three separate sets of instructions: one is for submitting the copyright form to IEEE, another is for verifying that your paper is compliant with IEEE's requirements for PDF files, and the third is for submitting the camera-ready paper.

You must adhere to the submission deadline APRIL 15, 2009. Please follow the instructions CAREFULLY; failure to complete any of these requirements may result in your paper being removed from CVPR09 workshop proceedings publication, and hence from Xplore.

1. Instructions for electronic submission of IEEE copyright form (eCF)

IMPORTANT: If you need to make changes to the title or author list, YOU MUST GO THROUGH INSTRUCTION SETS 2 and 3 FIRST.

eCF is done through CMT. Please log in to your workshop's CMT site and do the following in the Author role:
* Click on the Submit IEEE Copyright form link at the rightmost column (which initiates eCF). Please read instructions in the CMT and IEEE sites CAREFULLY.

* You need to go through eCF for EACH paper separately.
* Since eCF can only be done ONCE for each paper, it is important that only one person (contact author) work on it per paper.
* Once eCF has been completed, IEEE will email all the authors as verification.

2. Instructions for verifying compliance of the final version of your paper

* Make sure your PDF file is IEEE compliant. If your file is noncompliant, it WILL NOT be shipped to IEEE for inclusion in Xplore, which means your paper will not be considered as published.
* The easiest way to check for PDF compliance is to use the PDF eXpress web site (URL: Click on the link "New Users - Click Here" and fill in your information. You will need the Conference ID which is: cvpr09x
* Follow the links at for information on the specific elements of PDF compliance. The most frequent cause of noncompliant files is the use of a custom font that is not embedded in the PDF file. You must ensure that all fonts in the document (including those in figure captions, tables, and figure bodies/ legends) are embedded.

NOTE: The PDF eXpress validation process is NOT the final paper submission process! Once your paper is valid, you must follow instruction set 3.

3. Instructions for submitting camera-ready paper using CMT

The camera-ready paper is submitted through CMT. Please log in to your workshop's CMT site and do the following:
* For those who are area chairs or reviewers for CVPR09, go to the Author console. For all others, the Author console is the default page.
* CMT will not rename your files, so please use the following naming convention:
- If you wish to load a supplementary file, load the camera-ready file FIRST, then the supplementary file (loading is sequential).
- Please limit either file to 20 MB.
* Click on the "Edit" link under "Camera-Ready" and follow the instructions there.

Call for Papers 

With a very security conscious society, biometrics based authentication and identification have become center of focus for many important applications as it is believed that biometrics can provide accurate and reliable identification. Biometrics research and technology continue to mature rapidly, driven by pressing industrial and government needs and supported by industrial and government funding.  As the number and types of biometrics architectures and sensors increases, the need to disseminate research results increases as well.  This workshop is intended to be positioned at the frontier of biometrics research and showcase the most excellent and advanced work underway at academic and private research organizations as well as government labs. 

Many of the applications require higher level of accuracy performance not feasible with a single biometrics today. Additionally, it is also believed that fusing multiple biometrics will also improve wider coverage of population who may not be able to provide a single biometrics and also improve security of the systems in terms of spoof attacks. This workshop will address all aspects of research issues in different modes and levels of fusion of biometrics samples, sensing modes and modalities with a sole goal of improving performance of biometrics. Theoretical studies on sensor fusion techniques applied to biometrics authentication, recognition and performance are encouraged. The topics of interest are: 

- Sensing; intensity, depth, thermal, pressure, time-series, exotic 
- Face, finger, ear, eye, iris, retina, vein pattern, palm, gait, foot, exotic
- Biometric template computation and feature extraction, matching 
- Data and performance baselines 
- Evolution of standards, competitions and organized challenge problems 
- Score level, decision level and feature level integration 
- Architectures for integration, evidence integration 
- Fusion based identification techniques 
- Normalization techniques involved in fusion techniques 
- Machine learning techniques in biometrics fusion 
- Public databases and score files in multi-biometrics 
- Application dependence personalization of multi-biometrics systems 
- Theoretical studies in showing models for integration 
- Performance modeling, prediction and evaluation of multi-biometrics systems
- Security improvement assessment for multi-biometrics systems 


Bir Bhanu (Professor, University of California, Riverside,
Nalini K. Ratha (Research Staff Member, IBM Research,
Venu Govindaraju (Professor, SUNY Buffalo,

Program Committee:  

Josef Bigun,  Halmstad University, Sweden
Michael Boshra,  Authentec, USA 
Kevin Bowyer, Notre Dame University, USA
Rama Chellappa,  University of Maryland, USA
Hui Chen, Motorola, USA
Amit Roy-Chowdhary, University of California, Riverside, USA 
Julian Fierrez, Universidad Autonoma de Madrid, Spain
Pat Flynn,  University of Notre Dame, USA
Venu Govindraju,  University of Buffalo, USA
Ju Han, Lawrence Berkeley National Laboratory, USA
Jaihie Kim,  Yonsei University, South Korea
Josef Kittler,  University of Surrey, UK 
Ajay Kumar,  IIT, New Delhi, India 
Vijaya Kumar,  Carnegie Mellon University, USA
Larry Nadel,  Noblis, USA
Ioannis Pavlidis, University of Houston, USA
Jonathon Phillips,  NIST, USA
Fabio Roli,  University of Cagliari, Italy 
Arun Ross,  West Virginia University, USA
Tieniu Tan,  CAS, China
Xunjun Tan,  QMotions, USA 
Massimo Tistarelli,  Univ. Of Sassari, Italy 
Pramod Varshney,  Syracuse University, USA
Jim Wayman,  San Jose State University, USA
Juneho Yi, Sungkyunkwan University, Korea
David Zhang,  Polytech University, Hong Kong 


- Several oral paper sessions 
- Invited talks 
- A poster session 


Paper submission: March 13, 2009, 11:59pm. PST (Pacific Standard Time) 
Reviews completed: April 10, 2009 
Final Papers due: April 13, 2009

All the selected papers will be included in CVPR-DVD.  

Paper Submission: 

For the paper submission, please follow the instructions on the website:
The format of the paper is the same as the CVPR Conference paper.
The size of the paper is 6 pages. The review process will be anonymous, names of author(s) should not be mentioned in the paper.

Accepted Papers: 

For the accepted papers, please go to the following link:

Final Workshop Program: 

For the final program of the workshop, please check the following link:
CVPR Biometrics 2009 Final Program

Invited Talk: 

Best Paper Awards for: 

Edited Book: 

The organizers are planning an edited book. The papers submitted to this workshop will be considered for the edited book.
Please see the link: