Kevin Bowyer, Notre Dame
University, USA
Josef Bigun,
Halmstad University, Sweden
Michael Boshra, Authentec, USA
Patrizio Campisi, University of
Roma Tre, Italy
Hui Chen, MorphoTrak,USA
Rama Chellappa, University of
Maryland, USA
Amit Roy-Chowdhary, University of
California, Riverside, USA
Patrick Grother, NIST, USA
Ioannis Kakadiaris, University of Houston, USA
Jaihie Kim, Yonsei University,
South Korea
Josef Kittler,
University of Surrey, UK
Vijaya Kumar,
Carnegie Mellon University, USA
Ludmila Kuncheva, University of
Wales, UK
Larry Nadel,
Noblis, USA
Ju Han, Lawrence Berkeley
National Laboratory, USA
Jonathon Phillips, NIST, USA
Fabio Roli,
University of Cagliari, Italy
Arun Ross, West Virginia
University, USA
Ifeoma Nwogu, University of Rochester, USA
Ioannis Pavlidis, University of Houston, USA
Dijana Petrovska, Telecom
SudParis, France
Tieniu Tan,
NLPR, China
Xunjun Tan, QMotions, USA
Massimo Tistarelli,
University of Sassari, Italy
Pramod Varshney,
Syracuse University, USA
Jim Wayman,
San Jose State University, USA
David Zhang, Hong Kong
Polytechnic University, Hong Kong